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Flip chip packaging of digital silicon photonics MEMS Switch for cloud computing and data centre

机译:用于云计算和数据中心的数字硅光子MEMS开关的倒装芯片封装

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摘要

We report on the flip chip packaging of Micro-Electro-Mechanical System (MEMS)-based digital silicon photonic switching device and the characterization results of 12 × 12 switching ports. The challenges in packaging N2 electrical and 2N optical interconnections are addressed with single-layer electrical redistribution lines of 25 µm line width and space on aluminum nitride interposer and 13° polished 64-channel lidless fiber array (FA) with a pitch of 127 µm. 50 µm diameter solder spheres are laser-jetted onto the electrical bond pads surrounded by suspended MEMS actuators on the device before fluxless flip-chip bonding. A lidless FA is finally coupled near-vertically onto the device gratings using a 6-degree-of-freedom (6-DOF) alignment system. Fiber-to-grating coupler loss of 4.25 dB/facet, 10–11 bit error rate (BER) through the longest optical path, and 0.4 µs switch reconfiguration time have been demonstrated using 10 Gb/s Ethernet data stream.
机译:我们报告了基于微电子机械系统(MEMS)的数字硅光子开关器件的倒装芯片封装以及12×12个开关端口的表征结果。封装N2电气和2N光学互连的挑战可通过在氮化铝中介层和间距为127 µm的13°抛光的64通道无盖光纤阵列(FA)上形成线宽和间距为25 µm的单层电重新分配线来解决。在进行无助焊剂倒装芯片键合之前,将直径为50 µm的焊球激光喷射到器件上悬挂的MEMS致动器围绕的电键合焊盘上。最后,使用6自由度(6-DOF)对准系统将无盖FA几乎垂直地耦合到器件光栅上。使用10 Gb / s以太网数据流已证明,光纤到光栅的耦合器损耗为4.25 dB / facet,通过最长的光路的误码率(BER)为10–11,开关重新配置时间为0.4 µs。

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