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Fabrication of sub-10 nm lamellar structures by solvent vapour annealing of block copolymers

机译:通过嵌段共聚物的溶剂蒸汽退火制备亚10纳米以下层状结构

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摘要

Fabrication of nanoscale patterns through the bottom-up approach of self-assembly of phase-separated block copolymers (BCP) holds promise for nanoelectronics applications. For lithographic applications, it is useful to vary the morphology of BCPs by monitoring various parameters to make “from lab to fab” a reality. Here I report on the solvent annealing studies of lamellae forming polystyrene-blockpoly( 4-vinylpyridine) (PS-b-P4VP). The high Flory-Huggins parameter (χ = 0.34) of PS-b-P4VP makes it an ideal BCP system for self-assembly and template fabrication in comparison to other BCPs. Different molecular weights of symmetric PS-b-P4VP BCPs forming lamellae patterns were used to produce nanostructured thin films by spin-coating from mixture of toluene and tetrahydrofuran(THF). In particular, the morphology change from micellar structures to well-defined microphase separated arrangements is observed. Solvent annealing provides a better alternative to thermal treatment which often requires long annealing periods. The choice of solvent (single and dual solvent exposure) and the solvent annealing conditions have significant effects on the morphology of films and it was found that a block neutral solvent was required to realize vertically aligned PS and P4VP lamellae. Here, we have followed the formation of microdomain structures with time development at different temperatures by atomic force microscopy (AFM). The highly mobilized chains phase separate quickly due to high Flory-Huggins (χ) parameter. Ultra-small feature size (~10 nm pitch size) nanopatterns were fabricated by using low molecular weight PSb- P4VP (PS and P4VP blocks of 3.3 and 3.1 kg mol-1 respectively). However, due to the low etch contrast between the blocks, pattern transfer of the BCP mask is very challenging. To overcome the etch contrast problem, a novel and simple in-situ hard mask technology is used to fabricate the high aspect ratio silicon nanowires. The lamellar structures formed after self-assembly of phase separated PS-b-P4VP BCPs were used to fabricate iron oxide nanowires which acted as hard mask material to facilitate the pattern transfer into silicon and forming silicon nanostructures. The semiconductor and optical industries have shown significant interest in two dimensional (2D) molybdenum disulphide (MoS2) as a potential device material due to its low band gap and high mobility. However, current methods for its synthesis are not ‘fab’ friendly and require harsh environments and processes. Here, I also report a novel method to prepare MoS2 layered structures via self-assembly of a PS-b-P4VP block copolymer system. The formation of the layered MoS2 was confirmed by XPS, Raman spectroscopy and high resolution transmission electron microscopy.
机译:通过自分离的相分离嵌段共聚物(BCP)自下而上的方法来制造纳米级图案,对纳米电子应用前景广阔。对于光刻应用,通过监视各种参数以实现“从实验室到晶圆厂”来改变BCP的形态非常有用。在这里,我报道了形成聚苯乙烯-嵌段聚(4-乙烯基吡啶)(PS-b-P4VP)的薄片的溶剂退火研究。 PS-b-P4VP的高Flory-Huggins参数(χ= 0.34)使其成为与其他BCP相比自组装和模板制造的理想BCP系统。使用不同分子量的形成片状图案的对称PS-b-P4VP BCP,通过旋涂由甲苯和四氢呋喃(THF)的混合物制备纳米结构的薄膜。特别地,观察到从胶束结构到明确定义的微相分离排列的形态变化。溶剂退火是热处理的更好选择,而热处理通常需要较长的退火时间。溶剂的选择(单次和两次暴露于溶剂中)和溶剂退火条件对薄膜的形貌有显着影响,并且发现需要嵌段中性溶剂来实现垂直排列的PS和P4VP薄片。在这里,我们通过原子力显微镜(AFM)跟踪了在不同温度下随时间发展的微区结构的形成。由于高Flory-Huggins(χ)参数,高度动员的链相迅速分离。通过使用低分子量PSb-P4VP(分别为3.3和3.1 kg mol-1的PS和P4VP嵌段)制备超小特征尺寸(约10 nm间距尺寸)的纳米图案。但是,由于块之间的蚀刻对比度低,因此BCP掩模的图案转印非常具有挑战性。为了克服蚀刻对比问题,使用新颖且简单的原位硬掩模技术来制造高纵横比的硅纳米线。自相分离的PS-b-P4VP BCP自组装后形成的层状结构用于制造氧化铁纳米线,该线用作硬掩模材料以促进图案转移到硅中并形成硅纳米结构。半导体和光学行业因其低带隙和高迁移率而对二维(2D)二硫化钼(MoS2)作为潜在的器件材料表现出了浓厚的兴趣。但是,目前的合成方法并不适合fab,并且需要苛刻的环境和工艺。在这里,我还报告了一种通过PS-b-P4VP嵌段共聚物体系的自组装制备MoS2层状结构的新方法。通过XPS,拉曼光谱和高分辨率透射电子显微镜确认了层状MoS 2的形成。

著录项

  • 作者

    Chaudhari Atul;

  • 作者单位
  • 年度 2015
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  • 原文格式 PDF
  • 正文语种 en
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