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InAlAs solar cell on a GaAs substrate employing a graded InxGa1-xAs-InP metamorphic buffer layer

机译:使用渐变InxGa1-xAs-InP变质缓冲层的GaAs衬底上的InAlAs太阳能电池

摘要

Single junction In0.52Al0.48As solar cells have been grown on a (100) GaAs substrate by employing a 1 mu m thick compositionally graded InxGa1-xAs/InP metamorphic buffer layer to accommodate the 3.9% mismatch. Cells processed from the 0.8 mu m thick InAlAs layers had photovoltaic conversion efficiency of 5% with an open circuit voltage of 0.72 V, short-circuit current density of 9.3 mA/cm(2), and a fill factor of 74.5% under standard air mass 1.5 illumination. The threading dislocation density was estimated to be 3 x 10(8) cm(-2). (C) 2013 American Institute of Physics. (http://dx.doi.org/10.1063/1.4789521)
机译:通过采用1微米厚的成分渐变InxGa1-xAs / InP变质缓冲层来适应3.9%的不匹配,已经在(100)GaAs衬底上生长了单结In0.52Al0.48As太阳能电池。在0.8微米厚的InAlAs层中处理的电池在7.21 V的开路电压,9.3 mA / cm(2)的短路电流密度和74.5%的填充因子在标准空气下的光电转换效率为5%质量1.5照明。穿线位错密度估计为3 x 10(8)cm(-2)。 (C)2013美国物理研究所。 (http://dx.doi.org/10.1063/1.4789521)

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