Atomic force microscope cantilever with reduced second harmonic frequency during tip-surface contact

摘要

We describe an atomic force microscope cantilever design for which the second flexural mode frequency can be tailored relative to the first mode frequency, for operation in contact with a substrate. A freely-resonating paddle internal to the cantilever reduces the stiffness of the second flexural mode relative to the first while nearly maintaining the mass of the original cantilever. This strategy allows the ratio of the first two resonant modes f2/f1 to be controlled over the range 1.6 ??? 4.5. The ability to vary f2/f1 could improve a variety of dynamic contact-mode measurements.