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Character of the electronic states near the metal-insulator transition in Gallium Manganese Arsenide

机译:镓锰砷中金属 - 绝缘体转变附近电子态的特征

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摘要

The character of electronic states near the Mott-Anderson metal-insulator transition in the ferromagnetic semiconductor Ga1-xMnxAs is studied by cross sectional scanning tunneling microscopy. 200nm thick samples grown by MBE at UCSB with doping levels from 1.5%, close the metal-insulator transition, to 5%, deep into the metallic regime, were studied at 4.2K. The thickness of the samples ensured that the electronic states were 3D in character. Strong spatial fluctuations in the local density of states, as well as corrections in the density of states at the Fermi energy due to electron-electron interactions in the presence of disorder are observed. The correlation length of the local density of states also grows significantly approaching the Fermi energy. These effects persist even in the highest doped samples, suggesting that disorder plays a profound role in the character of the electronic states and that even metallic samples are still close to the metal-insulator transition. These effects are expected to be of importance in moving beyond simple mean-field models of carrier-mediated ferromagnetism that ignore the spatial fluctuations in the density of states. Moreover, as the Mott-Anderson transition is little understood in the 3D materials where both interactions and strong disorder are equally important, these observations may provide important new insight by direct observation of the states involved. Further work is presented here comparing individual defects present in GaMnAs with their properties in a non-magnetic GaAs environment. Mn and other transition metals substituted into the first atomic layer of GaAs by STM manipulation were also studied to observe chemical trends. It is found that the effects of the symmetry breaking by the surface can account for the observed in-gap states.
机译:通过截面扫描隧道显微镜研究了铁磁半导体Ga1-xMnxAs中Mott-Anderson金属-绝缘体跃迁附近的电子态特征。 MBE在UCSB上生长的200nm厚度的样品在4.2K下研究了掺杂水平,掺杂水平从1.5%(接近金属-绝缘体过渡)到5%(深入金属状态)。样品的厚度确保了电子态的3D特性。观察到在存在无序的情况下,由于电子-电子相互作用,状态局部密度的强烈空间波动以及费米能量处的状态密度的校正。状态局部密度的相关长度也随着费米能量的增加而显着增长。这些效应甚至在掺杂最高的样品中也持续存在,这表明无序在电子态的特征中起着重要作用,甚至金属样品也仍然接近金属-绝缘体的转变。在超越载流子介导的铁磁性的简单均场模型而忽略了状态密度的空间波动的情况下,这些影响有望发挥重要作用。此外,由于在相互作用和强烈无序性都同样重要的3D材料中对Mott-Anderson转变的了解很少,因此这些观察结果可能通过直接观察所涉及的状态而提供重要的新见解。在此提出了进一步的工作,将GaMnAs中存在的单个缺陷与其在非磁性GaAs环境中的性能进行了比较。还研究了通过STM操作取代到GaAs第一原子层中的Mn和其他过渡金属,以观察化学趋势。发现表面对称性破坏的影响可以解释观察到的间隙内状态。

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    Richardella Anthony;

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  • 年度 2009
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  • 原文格式 PDF
  • 正文语种 {"code":"en","name":"English","id":9}
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