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A method for assessing measurement precision and stability of optical probes

机译:一种评估光学探头测量精度和稳定性的方法

摘要

The current strategy for measuring non-specular metre-scale surfaces – for instance segmented freeform optics post-grinding – in the mid- frequency bandwidths (S-filter), involves the use of contact probe based systems where measurement precision is a limiting factor. Equivalent non-contact optical probes claim accuracies up to an order of magnitude higher and could therefore improve current measurement systems. Chromatic confocal probes measure the distance to a surface using the principle of axial chromatic dispersion. The stability of a CHRocodile SE 300 μm probe was shown to be 200 ± 20 nm over an eight hour measurement period. A probe holder should be designed with a low thermal expansion material in order to thermally insulate the probe measurement for further investigation. The accuracy of the probe was assessed at the extremes of its measurement range. The maximum deviation over a 5 μm displacement was measured to be 85 nm. The entire measuring range should be investigated.
机译:当前在中频带宽(S滤波器)中测量非镜面米级表面(例如,分段自由曲面光学元件后研磨)的策略涉及使用基于接触探针的系统,其中测量精度是一个限制因素。等效的非接触式光学探针要求的准确度要高出一个数量级,因此可以改善电流测量系统。彩色共聚焦探头使用轴向色散原理测量到表面的距离。在八小时的测量时间内,CHRocodile SE 300μm探针的稳定性显示为200±20 nm。探头支架应采用低热膨胀材料设计,以使探头测量值热绝缘,以供进一步研究。在测量范围的极限处评估探针的准确性。经测量,在5μm位移上的最大偏差为85 nm。应调查整个测量范围。

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