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Contacts to P-doped GaAs Nanowires by Fabrication of Electrodes using Metals and Graphene

机译:通过使用金属和石墨烯制造电极与P掺杂的GaAs纳米线接触

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摘要

P-type GaAs semiconducting nanowires (NWs) with NW/electrode contacts have been examined by fabricating single NW devices to investigate their electrical properties. Both NWs grown with Au-assisted and Ga-assisted vapor-liquid-solid (VLS) method have been examined, with great emphasis on Ga-assisted NWs because these show superior contact properties. The NWs were grown using molecular beam epitaxy (MBE) and electrical contacts were fabricated using electron beam litography, electron beam evaporation for metallization and annealing to enhance ohmic behaviour of the contacts. Two different types of contacts were tested. One was metal contacts where various combinations of metal layers were tested, including such metallizations as Pt/Ti/Pt/Au and Pd/Zn/Pd/Au. The second electrode type was graphene which is expected to show very interesting electric and optoelectronic properties.It is shown in this thesis that ohmic contact with linear I-V characteristics has been achieved by two different methods. The first being annealing of the NW contact after contact fabrication. The second is by increasing doping concentration during NW growth. It is also shown that Pt/Ti/Pt/Au metallization is the layer configuration that exhibits the best ohmic contact and the most consistency in electrical measurements. 4-probe measurements were also carried out to measure the intrinsic resistivity of the NW, which makes it possible to estimate its doping concentration and carrier mobility.NW/graphene contact was also tried.Mechanical exfoliation of kish graphite was performed to make high-quality graphene, which was selctively placed to make NW contact. However it is found that heating of the EBL-resist during e-beam evaporation caused the graphene to wrinkle and dissolve. CVD-grown graphene on Cu-foil was also tested. Inspection after the graphene transfer proved that the graphene that was used was incontinous and flaky making it difficult to obtain proper contacts to NWs. In addition the NWs connected to graphene probably suffered from over-etching due to multiple etching steps. Since a lot of efforts was put into obtaining a suitable measure of making NW/graphene contacts only preliminary measurements were conducted, so these results has yet to be verified.
机译:通过制造单个NW器件来研究具有NW /电极触点的P型GaAs半导体纳米线(NW),以研究其电性能。已经研究了用金辅助和镓辅助气液固(VLS)方法生长的两种NW,特别强调了Ga辅助NW,因为它们显示出优异的接触性能。使用分子束外延(MBE)生长NW,并使用电子束光刻,电子束蒸发进行金属化和退火以增强触点的欧姆性能来制造电触点。测试了两种不同类型的触点。一种是金属触点,其中测试了金属层的各种组合,包括诸如Pt / Ti / Pt / Au和Pd / Zn / Pd / Au的金属化。第二种电极类型是石墨烯,有望表现出非常有趣的电和光电性能。本论文表明,通过两种不同的方法可以实现具有线性I-V特性的欧姆接触。首先是在触点制造之后对NW触点进行退火。第二是在NW生长期间增加掺杂浓度。还表明,Pt / Ti / Pt / Au金属化是在电测量中表现出最佳欧姆接触和最一致的层配置。还进行了4探针测量,以测量NW的固有电阻率,从而可以估算其掺杂浓度和载流子迁移率;还尝试了NW /石墨烯接触;对Kish石墨进行了机械剥离,以制成高质量石墨烯,选择性地放置以使其与NW接触。但是,发现在电子束蒸发过程中加热EBL抗蚀剂会导致石墨烯起皱和溶解。还测试了CVD生长在铜箔上的石墨烯。石墨烯转移后的检查证明,所用的石墨烯不连续且呈片状,使得难以与NW取得适当的接触。另外,由于多个蚀刻步骤,连接至石墨烯的NW可能遭受过度蚀刻。由于为获得制备NW /石墨烯接触的合适方法付出了很多努力,因此仅进行了初步测量,因此这些结果尚待验证。

著录项

  • 作者

    Christoffersen Ole Morten;

  • 作者单位
  • 年度 2012
  • 总页数
  • 原文格式 PDF
  • 正文语种 eng
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