Elemental composition, topography and wettability of PbxSn1-xS thin films.

摘要

PbSnS thin films were prepared by hot-wall vacuum evaporation (HWVE). The Rutherford backscattering technique was employed for the investigation of PbxSn1-xS thin films composition. With a help of AFM the main stages in the development of the thin films were characterized. Contact angle measurements of water drop on PbxSn1-xS thin films have been conducted on our original setup.