Dual-Port Circularly Polarized Probe Standards at the National Institute of Standards and Technology

摘要

The National Institute of Standards and Technology has acquired dual-port circularly polarized probes to use as gain and near-field probe standards for measuring circularly polarized test antennas. These probes will serve as standards for the 18 to 26.5, 33 to 50, and 50 to 70 GHz frequency bands. The paper discusses the need for such standards, their design requirements, the measurement results for gain, polarization, and pattern, and an uncertainty analysis of the measurements.