RL/NIST Workshop on Moisture Measurement and Control for Microelectronics. Proceedings of the RL/NIST Workshop held in Gaithersburg, Maryland on April 5-7, 1993

摘要

The document is a compilation of papers presented at the title workshop, fifth in a series since 1978 addressing ingress mechanisms, effects, and methods of measuring moisture in electronic packages, mainly used in military and biological applications.