Symposium International d'Emission de Champ (41ieme): Programme et Resumes,Rouen, France, Juillet 11-15, 1994 (International Field Emission Symposium (41st): Program and Abstracts. Held in Rouen, France on July 11-15, 1994)

摘要

These proceedings offer 91 English-language abstracts of lectures given at the41st International Field Emission Symposium held in Rouen, France July 11-15, 1994. Lecture topic categories include field emission, theory and processes; instrumentation and new methods; two E. W. Muller outstanding young scientist medal competitions; Scanning Tunneling Microscopy (STM) and Field Ion Microscopy (FIM) techniques in surface science; three-dimensional atom probe techniques; field emission and vacuum microelectronics; FIM atom probe techniques and material science; surface chemistry and FIMS; atom probe, interpretation of data; FIM atom probe techniques and material science; field ionization and liquid metal ion sources; and scanning tunneling microscopy. Invited lectures dealt with various related topics.