Metrology for Information Technology (IT)

摘要

The scope of the white paper is the testing or measuring of digital informationtechnology (IT) systems attributes or properties; the use of digital IT systems in testing and measuring; and the underlying mathematical, computational, and statistical sciences used in testing and measuring. The paper suggests a conceptual basis for IT metrology; reviews IT testing methods, the status of IT metrology, and opportunities for advancing IT metrology; and notes possible roles for NIST.