X-RaY Diffraction Studies of Piezoelectric Crystals First Quarterly Progress Report 15 November 1952 to 14 February 1953

摘要

The chief instrumentation is in specialized X-ray diffraction equipment, static single-crystal studies over a range of temperatures, and involving precise X-ray intensity measurements. The X-ray studies provide information on the disposition of, and bonding between, atoms in the crystals and how these are altered when the crystals become polarized.