Transistor Oscillators of Extended Frequency Range

摘要

A laboratory-constructed temperature test chamber is described, and some data on temperature stability of transistor oscillators, obtained by making use of the test chamber, are presented herein. The best temperature stability g obtained is 4 parts in 108 for 1℃ temperature change, with an oscillator having a voltage stability of 1 part in 108 for a 1 per cent voltage change. This oscillator makes use of a point-contact transistor. Circuit schematics are presented for Junction-transistor oscillators having similar orders of stability.