Research Initiation. Computer Aided Tolerance Assignment for Microelectronic Circuits.

摘要

The work consisted of an experimental phase using untrimmed thick-film resistor arrays and a phase in which computer-aided design methods were developed. The experiments were designed to test the effect of various factors on the correlation between thick-film resistors and also on the shape of the probability density function of thick-film resistors. An algorithm was developed for computer-aided tolerance design in which the circuit element standard deviations and one correlation coefficient are design variables. A method was developed for the computer generation of sets of correlated resistor values which have skewed distributions.