Characterization of Suspended Particulates on Multicomponent Systems

摘要

The research investigated the use of two optical in-situ techniques to measure submicron particle size. The pointer beam technique offers good potential for measurement of particles 0.1 um and larger. The polarization intensity ratio is subject to severe oscillations which limit the size regions where it is useful. In the report, the theoretical analysis of the two techniques has been performed. Numerical experiments have been done to illustrate how the scattering functions of interest change with the relevant parameters and the errors that will result from the uncertainty in such parameters. The dynamic range and sensitivity of each technique have been examined. A preliminary breadboard experiment has been performed to prove the theoretical analysis.