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TEM (Transmission Electron Microscope), Positron Lifetime and Hardness Measurements of Irradiated, Cold-Worked and Annealed Zr-1%Nb

机译:TEm(透射电子显微镜),正电子寿命和辐照,冷加工和退火Zr-1%Nb的硬度测量

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Tensile specimens of Zr-1%Nb plate were irradiated in Loviisa I NPP for one year during 1978-1979. The previous examinations with the specimens consisted of tensile tests at 24 C and 280 C. The defect structures present in the material after different treatments and the recovery of defects in thermal annealing were examined with transmission electron microscope (TEM) and by hardness and positron lifetime measurements. Four different treatment variations were included: recrystallized (unirradiated), irradiated, heavily cold-worked (unirradiated) and both irradiated and cold-worked. The TEM examinations showed high defect density both in the as-irradiated and in the cold-worked specimens. Only slight (if any) change could be observed in the microstructure after one hour annealing at 400 C. The recovery behavior of the as-irradiated and cold-worked specimens found by the hardness and positron lifetime measurements were vey close to each other. The measurements showed that the recovery occurred mainly at 450-550 C. The results are compared to those presented in the literature for zirconium. Reference is also made to the results of the previous tensile tests. (Copyright (c) Valtion teknillinen tutkimuskeskus (VTT) 1989.)

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