Semiconductor Measurement Technology: A Programmable Reserse-Bias Safe OperatingArea Transistor Tester

摘要

The circuits and construction of a transistor turn-off breakdown tester aredescribed. Principles of operation for various circuits in the tester are discussed, as well as those for the complete system. Construction notes are given with layout guidelines. Included are complete circuit schematics and details of construction of special parts used in the tester. Specifications and performance data are also given in the document.