NIST X-ray Photoelectron Spectroscopy (XPS) Database

摘要

The technique known as XPS (X-Ray Photoelectron Spectroscopy) involves x-rayirradiation of surface samples under high vacuum. Electrons escaping from the samples are sorted and arranged to form a spectrum. A compilation of data for binding energy and kinetic energy of sample electrons from all elements has been collected. Depending on the nature of the chemical bond, the chemical shift can be as much as 10 eV. Over the past 6 years the author has indexed articles related to the subject area. The data bank contains a total of 13,200 records, from a total of 800 papers.