Boundary Condition Effects in the Energy Loss Spectrum of Layered Systems

摘要

A method to calculate the electron energy loss (EEL) spectrum of a general layered system such as an interface is given. It is based on the concept of effective dielectric constant. Examples for model systems are given. The method is applied to the experimental EEL spectra of Ag-Si and those of the oxidation of silicon. Interpretation of the loss spectra taken at different primary beam energy, and plasma loss intensities associated with a core level peak in photoemission or Auger spectroscopy are discussed.