The NASA Lewis Strain Gauge Laboratory: An update

摘要

Efforts continue in the development and evaluation of electrical resistance strain gauges of the thin film and small diameter wire type. Results obtained early in 1986 on some Chinese gauges and Kanthal A-1 gauges mounted on a Hastelloy-X substrate are presented. More recent efforts include: (1) the determination of the uncertainty in the ability to establish gauge factor, (2) the evaluation of sputtered gauges that were fabricated at Lewis, (3) an investigation of the efficacy of dual element temperature compensated gauges when using strain gauge alloys having large thermal coefficients of resistance, and (4) an evaluation of the practical methods of stabilizing gauges whose apparent strain is dependent on cooling rate (e.g., FeCrAl gauges).