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Functional Interrupts and Destructive Failures from Single Event Effect Testing of Point-Of-Load Devices.

机译:功能点中断和负载点设备单事件效应测试的破坏性故障。

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摘要

We show examples of single event functional interrupt and destructive failure in modern POL devices. The increasing complexity and diversity of the design and process introduce hard SEE modes that are triggered by various mechanisms.

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