A Strip-Yield Model for Predicting the Growth of Part-Through Cracks Under Cyclic Loading

摘要

Flaws exist in aircraft structures due to manufacturing operations and material defects. Under variable amplitude cyclic loading, these flaws grow as part-through cracks reducing the residual strength of structural components. To meet damage tolerant design requirements, accurate flaw growth predictions are needed which account for continual changes in crack shape as well as crack growth retardation and acceleration. Predicting the growth of part-through cracks under cyclic loading using an innovative and computationally efficient model is the focus of the research summarized in this report. In this research effort, a slice synthesis methodology was developed and used to construct a modified strip-yield model for the part-through semi-elliptical surface flaw, enabling prediction of plasticity-induced closure along the crack front and subsequent fatigue crack growth under constant amplitude and variable amplitude loading. While modeling the plasticity-induced closure in a part-through flaw may be performed using three dimensional elastic-plastic finite element analysis, this type of effort is impractical from an engineering perspective. A modified strip-yield model similar to that used in FASTRAN for part-through flaws is a much needed engineering design tool, particularly when computational resources are limited.