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Feasibility Study of Auger and Photoelectron Spectroscopy as an Analytical Technique

机译：俄歇和光电子能谱作为分析技术的可行性研究

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作者
Adler, I.; Lamothe, R.; Yin, L. I.;
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年度 1968
页码 1-3
总页数 3
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Auger effect ; Photoelectrons ; Spectrometers ; Spectroscopic analysis ; Calibrating ; X ray spectroscopy;

机译：俄歇效应;光电子;光谱仪;光谱分析;校准; X射线光谱;

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专利

1. Site-specific ion desorption from condensed F_3SiCD_2CH_2Si(CH_3)_3 induced by Si-2p core-level ionizations studied with photoelectron photoion coincidence (PEPICO) spectroscopy, Auger photoelectron coincidence spectroscopy (APECS) and Auger electron photoion coincidence (AEPICO) spectroscopy [J] . Kazuhiko Mase, Eiichi Kobayashi, Akira Nambu, Surface Science . 2013,第JANa期

机译：Si-2p核心能级电离引起的凝聚F_3SiCD_2CH_2Si（CH_3）_3的位点特定离子解吸，通过光电子重合能谱（PEPICO），俄歇光电子重合能谱（APECS）和俄歇光电子重合能谱（AEPICO）研究
2. Line structure in photoelectron and Auger electron spectra of CuOx/Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS) [J] . Jiang ZT., Wilkie P., Thurgate SM. Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2001,第4期

机译：俄歇光电子符合光谱法（APECS）分析CuOx / Cu和Cu的光电子和俄歇电子谱线
3. X-ray photoelectron and Auger electron spectroscopy (Reprinted from Analytical Instrumentation Handbook, Second Edition, Revised and Expanded, pg 863, 1997) [J] . Turner NH. Applied Spectroscopy Reviews: An International Journal of Principles, Methods, and Applications . 2000,第3期

机译：X射线光电子和俄歇电子能谱（转载自《分析仪器手册》，第二版，修订和扩展，第863页，1997年）
4. An Auger Electron Spectroscopy (AES) and X-Ray Photoelectron Spectroscopy (XPS) Study of CVD and Natural diamonds [C] . J. Y. Howe, L. E. Jones, David N. Braski Biennial conference on carbon : Extended abstracts and progra;Conference on carbon : Extended abstracts and progra;CARBON '99 . 1999

机译：CVD和天然钻石的俄歇电子能谱（AES）和X射线光电子能谱（XPS）研究
5. Characterization of the electronic and geometric structures of aluminas using X-ray photoelectron spectroscopy, Auger electron spectroscopy, electron energy loss spectroscopy, and low energy electron diffraction. [D] . Kao, Chi-Chang. 1988

机译：使用X射线光电子能谱，俄歇电子能谱，电子能量损失能谱和低能电子衍射来表征氧化铝的电子和几何结构。
6. Valence band behaviour of zirconium oxide Photoelectron and Auger spectroscopy study [O] . Zakaria Azdad, Laurent Marot, Lucas Moser, -1

机译：氧化锆的价带行为光电子和俄歇光谱研究
7. Preparation of ZrO2 on flat, conducting SiO2/Si(100) model supports by wet chemical techniques : X-ray photoelectron spectroscopy and Auger depth profiling [O] . Eshelman, LM, Jong, de, AM Arthur, Niemantsverdriet, JW Hans 1991

机译：通过湿化学技术在平面导电SiO2 / Si（100）模型载体上制备ZrO2：X射线光电子能谱和俄歇深度剖析

Feasibility Study of Auger and Photoelectron Spectroscopy as an Analytical Technique

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