The applications of remote sensing to corn blight detection and crop yield forecasting

摘要

Photography revealed the widespread and variable effects of southern corn leaf blight in Indiana. Three levels of severity of the infection could be discerned from good quality color and color infrared photography. As many as five severity levels appeared to be detectable and classifiable with multispectral scanner data and pattern recognition analysis. These conclusions are preliminary in nature, however, having been obtained from a limited amount of good quality scanner data collected over a small geographic area.