Crystallographic and metallurgical characterization of radiation detector grade cadmium telluride materials.

摘要

Radiation detector grade CdTe crystals are characterized by several crystallographic and metallurgical techniques including infrared microscopy, dislocation etch pitting and X-ray diffraction. Results are presented for a set of 50 detectors fabricated from an ingot produced by the High Pressure Bridgman method. Data on the temperature dependence of leakage current and pulse height analysis are presented, along with measurements of room temperature charge transport properties. Attempts to relate crystal structure to detector performance discussed.