Failure Analysis Component Expert System. Final report.

摘要

Failure Analysis Component Expert System (FACES) project developed an object-oriented prototype expert system to aid in the failure analysis of discrete bipolar transistors. Consulting services for the analysis rules and knowledge base were provided by Howard K. Dicken, DM DATA INC., Scottsdale, Arizona. Several new and unique approaches were developed to minimize the normally impossible number of combinations in a typical failure analysis flow. These included the use of a multibranch ''safe sequence'' process flow which is determined by the measured electrical failure mode. Limiting possible visual observations with associative physical parts created exclusion matrixes and ensured uniformity of the list box choices. The result is a system which not only can determine the failure mechanism with a very high probability but will also list the most likely root cause of the failure. The results of the analysis can be printed in text mode to provide an immediate summary report or incorporation of graphics into a more detailed report.