首页> 美国政府科技报告 >Development Of a Spatially Resolving X-Ray Crystal Spectrometer For Measurement Of Ion-Temperature (Ti) and Rotation-Velocity (v) Profiles in ITER
【24h】

Development Of a Spatially Resolving X-Ray Crystal Spectrometer For Measurement Of Ion-Temperature (Ti) and Rotation-Velocity (v) Profiles in ITER

机译:开发用于测量ITER中离子温度(Ti)和旋转速度(v)曲线的空间分辨X射线晶体光谱仪

获取原文

摘要

Two arrays will measure Ti and both poloidal and toroidal rotation velocity profiles. The measurement of many spatial chords permits tomographic inversion for the inference of local parameters. The instrument design, predictions of performance, and results from C-Mod are presented.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号