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Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA.

机译：美国宇航局候选航天器电子设备当前总电离剂量和位移损伤简编。

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摘要

Total ionizing dose and displacement damage testing is performed to characterize and determine the suitability of candidate electronics for NASA spacecraft and program use.

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作者
Campola, M. J.; Cochran, D. J.; O'Bryan, M. V.; Lauenstein, J.; Violette, D.; Xapsos, M. A.; Boutte, A. J.; Chen, D.; Gigliuto, R. A.; LaBel, K. A.; Pellish, J. A.; Ladbury, R. L.; Casey, M. C.; Wilcox, E. P.;
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年度 2015
页码 1-9
总页数 9
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Aerospace environments; Radiation effects; Ionizing radiation; Radiation dosage; Displacement; Damage; Proton damage; Spacecraft electronic equipment; Electronic equipment tests; Single event upsets; Electro-optics; Bipolar transistors;

机译：航空航天环境;辐射效应;电离辐射;辐射剂量;位移;损坏;质子损坏;航天器电子设备;电子设备测试;单事件干扰;电光学;双极晶体管;

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专利

1. Total Ionizing Dose Versus Displacement Damage Dose Induced Dark Current Random Telegraph Signals in CMOS Image Sensors [J] . Virmontois C., Goiffon V., Magnan P., Nuclear Science, IEEE Transactions on . 2011,第6期

机译：CMOS图像传感器中总电离剂量与位移损伤剂量引起的暗电流随机电报信号
2. Total Ionizing Dose and Displacement- Damage Effects in Microelectronics [J] . Charles C. Foster MRS bulletin . 2003,第2期

机译：微电子学中的总电离剂量和位移-损伤效应
3. Total Ionizing Dose Effects and Proton-Induced Displacement Damage on MoS₂-Interlayer-MoS₂ Tunneling Junctions [J] . Wang Pan, Perini Christopher J., OHara Andrew, IEEE Transactions on Nuclear Science . 2019,第1期

机译：MoS _{2 -层间-MoS _{2 隧道结的总电离剂量效应和质子诱导的位移损伤}}
4. Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA [C] . Campola Michael J., Cochran Donna J., Boutte Alvin J., IEEE Radiation Effects Data Workshop . 2015

机译：美国宇航局候选航天器电子设备当前总电离剂量和位移损伤简编
5. Total Ionizing Dose and Dose Rate Effects on (Positive and Negative) BJT Based Bandgap References [D] . Davis, Parker 2019

机译：总电离剂量和剂量率对（正负）BJT带隙基准的影响
6. Inception of electronic damage of matter by photon-driven post-ionization mechanisms [O] . W. Błachucki, Y. Kayser, J. Czapla-Masztafiak, 2019

机译：通过光子驱动的后电离机制引发物质的电子损伤
7. Compendium of Current Total Ionizing Dose Results and Displacement Damage Results for Candidate Spacecraft Electronics for NASA [O] . O'Bryan, Martha V., Cochran, Donna J., Buchner, Stephen P., 2007

机译：当前用于NASA的候选航天器电子设备的总电离剂量结果和位移损伤结果简编
8. Compendium of Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA. [R] . Cochran, D. J., Boutte, A. J., Chen, D., 2012

机译：美国宇航局候选航天器电子总离子剂量和位移损伤概要。

Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA.

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