Measurement of the temperature of cold highly charged ions produced in an electron beam ion trap

摘要

The temperature of highly charged titanium ions produced and trapped in an electron beam ion trap was determined by precisely measuring the broadening of the emission line profile caused by the thermal Doppler motion. The measured temperature ranges from about 700 eV for deeply trapped ions to about 70 eV for ions in a shallow trap. The latter value represents the lowest temperature at which the x-ray emission of collisonally excited heliumlike Ti20(+) ions has ever been recorded, and the measured transitions represent the narrowest x-ray lines observed from highly charged titanium ions.