In situ high voltage electron microscopy technique for the study of deformation and fracture: In multilayered materials

摘要

A novel, in situ, high voltage electron microscopy technique for the direct observation of the micromechanisms of tensile deformation and fracture in nanostructured materials is detailed. This technique is particularly well suited for the dynamic observations of deformation and fracture in multilayered materials. The success of this type of in situ technique is highly dependent upon unique specimen preparation procedures and sample design, the importance thereof will be discussed. The initial observations discussed here are expected to aid in the understanding of the mechanical behavior of this new class of atomically engineered materials.