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Novel method for diagnosing the growth of subresolution-scale perturbations

机译:诊断亚分辨率扰动增长的新方法

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We have demonstrated a technique for diagnosing the growth of subresolution-scale perturbations by the appearance of longer-wavelength, coupled modes once the growth has proceeded into the nonlinear regime. Comparison of the growth rate of this larger scale feature with numerical simulations can then be used to infer the growth rates of the initial perturbations. This experiment was conceived as an analog of large-scale computer simulations where the large eddy approximation is applied. There a subgrid-scale model is used to represent the effects of small scales on large-scale motion, which is directly numerically simulated.

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