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Comparison of Accelerated Testing with Modeling to Predict Lifetime of CPV Solder Layers. Presentation.

机译:加速测试与建模的比较预测CpV焊料层的寿命。介绍。

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Concentrating photovoltaic (CPV) cell assemblies can fail due to thermomechanical fatigue in the die-attach layer. In this presentation, we show the latest results from our computational model of thermomechanical fatigue. The model is used to estimate the relative lifetime of cell assemblies exposed to various temperature histories consistent with service and with accelerated testing. We also present early results from thermal cycling experiments designed to help validate the computational model.

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