Structural investigation of B(sup +) ion implantation induced amorphization in polycrystalline Ni thin films

摘要

High fluence metalloid ion implantation have been shown to induce amorphous phase formation in transition metals systems. In this study, electron energy loss spectroscopy and energy filtered selective area electron diffraction have been used along with conventional TEM to characterize the structural and electronic changes resulting from B(sup +) ion implantation into polycrystalline Ni thin films.