Emittance measurement system for a wide range of bunch charges

摘要

As a part of the emittance measurements planned for the FEL injector at the Thomas Jefferson National Accelerator Facility (Jefferson Lab), the authors have developed an emittance measurement system that covers the wide dynamic range of bunch charges necessary to fully characterize the high-DC-voltage photocathode gun. The measurements are carried out with a variant of the classical two-slit method using a slit to sample the beam in conjunction with a wire scanner to measure the transmitted beam profile. The use of commercial, ultra-low noise picoammeters makes it possible to cover the wide range of desired bunch charges, with the actual measurements made over the range of 0.25 pC to 125 pC. The entire system, including its integration into the EPICS control system, is discussed.