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X-Ray Characterization of Resistor/Dielectric Material for Low Temperature Co-211 Fired Ceramic Packages

机译:用于低温Co-211烧制陶瓷封装的电阻器/介电材料的X射线表征

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High temperature XRD has been employed to monitor the devitrification of Dupont211u001e951 low temperature co-fired ceramic (LTCC) and Dupont E84005 resistor Mc. The 211u001eLTCC underwent devitrification to an anorthite phase in the range of 835-875C 211u001ewith activation energy of 180 kJ/mol as calculated from kinetic data. The

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