Characterization and Modeling of Microstructure Development in Nickel-base211 Superalloy Welds

摘要

An atom probe field-ion microscope was used to characterize the water-quenched211u001esample. For APFIM, small needles were machined from the sample. These needles 211u001ewere electropolished using standard techniques. The samples were imaged at a 211u001etemperature range of 50 to 60 K and analyzed with a residual neon gas pressure of 211u001e3 X 10-7 Pa and a pulse fraction of 20% in the atom probe.