Near-Field Spectroscopy of Selectively Oxidized Vertical Cavity Surface Emitting Lasers;Applied Physics Letters

摘要

Selectively oxidized vertical cavity surface emitting lasers (VCSELs) have been studied by spectrally resolved near field scanning optical microscopy (NSOM). We have obtained spatially and spectrally resolved images of both subthreshold emission and lasing emission from a selectively oxidized VCSEL operating at a wavelength of 850 nm. Below threshold, highly local high gain regions, emitting local intensity maxima within the active area, were observed; these were found to serve as lasing centers just above threshold. Above threshold, the near field spatial modal distributions of low order transverse modes were identified by spectrally analyzing the emission; these were found to be complex and significantly different from those measured in the far field.