Photovoltaics Characterization: An Overview; Preprint

摘要

In order to move to a next generation of characterization methods, the211u001erequirements must be fully understood and documented. Presented herein are the 211u001erequired functionalities for the next generation of characterization methods. 211u001eThis paper is not meant to be exhaustive, but instead presents new developing 211u001echaracterization methods. The basic characterization requirements are outlined in 211u001ethe introduction. It is expected that in the future, phenomena will be understood 211u001eon the atomic scale and applied to large-scale arrays for a complete 211u001eunderstanding of the various affects that determine the real cell efficiency. 211u001eThere is a need for a fundamental understanding from atomic and nanoscale 211u001echaracterizations of impurities, native defects, extended defects and interfaces 211u001eto provide the necessary understanding of these types of PV cells. This 211u001einformation from fundamental probes should be used for input to the performance 211u001echaracterization of the developing technologies, which include high-211u001efluxoperation, multijunction and lower band-gap systems. These methods will allow 211u001enew materials to come to realization at a much faster rate than was possible in 211u001eprevious years.