Single Event Effects (SEE) Testing: Practical Approach to Test Plans.

摘要

While standards and guidelines for performing SEE testing have existed for several decades, guidance for developing SEE test plans has not been as easy to find. In this presentation, the variety of areas that need to be considered ranging from resource issues (funds, personnel, schedule) to extremely technical challenges (particle interaction and circuit application), shall be discussed. Note: We consider the approach outlined here as a living document: mission specific constraints and new technology related issues always need to be taken into account.