Characterization and Compensation of High Speed Digitizers

摘要

Increasingly, ADC technology is being pressed into service for single single-shot instrumentation applications that were formerly served by vacuum-tube based oscilloscopes and streak cameras. ADC technology, while convenient, suffers significant performance impairments. Thus, in these demanding applications, a quantitative and accurate representation of these impairments is critical to an understanding of measurement accuracy. We have developed a phase-plane behavioral model, implemented it in SIMULINK and applied it to interleaved, high-speed ADCs (up to 4 gigasamples/sec). We have also developed and demonstrated techniques to effectively compensate for these impairments based upon the model.