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Analysis of Heavy-Ion Single Event Effects for a Variety of Finite State-Machine Mitigation Strategies.

机译:多种有限状态机缓解策略的重离子单粒子效应分析。

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摘要

Finite state-machines (FSMs) are used to control operational flow in application specific integrated circuits (ASICs) and field programmable gate array (FPGA) devices. Because of their ease of interpretation, FSMs simplify the design and verification process and consequently are significant components in a synchronous design.

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