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THE SOLID-STATE SURFACE BARRIER CHARGED PARTICLE DETECTOR

机译:固态表面屏障带电粒子探测器

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Solid state charged particle detectors of semiconducting materials have been the subject of intensive research during the past few years ((1) – (8)). The detectors are an improvement on the earlier crystal counters, (9), of materials such as diamond, ZnS, CdS, etc., which are, of course, semiconductors themselves, but possess a low electron mobility leading to space charge formation, and a high density of defects, which causes trapping of the carriers.

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