ZAHLVERLUST IN ELEKTRONISCHER LOGIK DURCH STATISTIK UND TOTZEIT

摘要

Counting loss problems are discussed arising in the electronic equipment, when used in high energy experiments. Three types of errors are specified: counting loss, false signals and time-jitter. Some statistical relations are presented, which will lead to special test-methods. Finally the measuring device, which is used to test DESY standard electronics, will be described.