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ASTUDY OF FACTORS AFFECTING CALIBRATIONS AND CALCULATIONS FOR THE MONOCHROMATIC X-RAY ABSORPTION-EDGE ANALYTICAL METHOD

机译：影响单色X射线吸收边缘分析方法校准和计算的因素的研究

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摘要

A modified calculation equation gave results more closely following the known values of standard samples. Recommendations are given for improving the choice of standards and calibration procedure for the monochromatic X-ray absorption method.

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作者
R. E. Barringer;
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年度 1974
页码 1-21
总页数 21
原文格式 PDF
正文语种 eng
中图分类工业技术;
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机译：蒙特卡罗法和平均临界角对CR-39探测器在腔室内扩散的效率和校准系数的数值和解析计算
2. Monte Carlo calculations of the ionization chamber wall correction factors for 192Ir and 60Co gamma rays and 250 kV x-rays for use in calibration of 192Ir HDR brachytherapy sources. [J] . Ferreira IH, de Almeida-CE, Marre D, Physics in medicine and biology. . 1999,第8期

机译：用于192Ir HDR近距离放射治疗源校准的192Ir和60Coγ射线和250 kV X射线电离室壁校正因子的蒙特卡洛计算。
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机译：使用分层校准方法通过X射线荧光计算深度相关的元素浓度
4. Calibration of thickness-dependent k-factors for germanium X-ray lines to improve energy-dispersive X-ray spectroscopy of SiGe layers in analytical transmission electron microscopy [C] . Y Qiu, VH Nguyen, A Dobbie, Microscopy of Semiconducting Materials Conference . 2013

机译：用于锗X射线线的厚度依赖性K因子的校准，以改善分析透射电子显微镜中SiGe层的能量分散X射线光谱
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7. Calibration of thickness-dependent k-factors for germanium X-ray lines to improve energy-dispersive X-ray spectroscopy of SiGe layers in analytical transmission electron microscopy [O] . Qiu, Yi, Nguyen, Van Huy, Dobbie, A. (Andrew), 2013

机译：校准锗X射线线的依赖于厚度的k因子，以改善分析型透射电子显微镜中SiGe层的能量色散X射线光谱

ASTUDY OF FACTORS AFFECTING CALIBRATIONS AND CALCULATIONS FOR THE MONOCHROMATIC X-RAY ABSORPTION-EDGE ANALYTICAL METHOD

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