Analysis of Effects of Impurities Intentionally Incorporated into Silicon. Final Report, Feburary 1, 1977--December 1, 1977

摘要

A methodology has been developed and implemented to allow silicon samples containing intentionally incorporated impurities to be fabricated into finished solar cells under carefully controlled conditions. The electrical and spectral properties were then measured for each group processed, and this data, along with all the material, (cells and scrap) were delivered to JPL for further analysis. All 33 lots of Group ''C'', 14 lots of Group ''CM'' and 16 lots of Group ''F'' have been fabricated into cells, tested and delivered to JPL. (ERA citation 03:042437)