Surface Analysis Techniques and Their Use in Pollution Detection and Measurement

摘要

Surface analysis techniques such as Auger electron spectroscopy (AES), electron spectroscopy for chemical analysis (ESCA), secondary ion mass spectrometry (SIMS), and ion scattering spectrometry (ISS) are reviewed. The advantages and limitations of these methods are compared with bulk analysis techniques such as x-ray fluorescence spectroscopy, atomic absorption and emission spectroscopy, gas chromatography, and neutron activation analysis. Results otained using ESCA, AES, SIMS, ISS, and x-ray fluorescence analysis from automobile exhaust, laboratory-prepared samples, clean air, and biological samples are discussed. Possible future areas of research using surface techniques are discussed. 16 figures, 1 table. (ERA citation 04:030942)