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Fusion Target Analysis by Quantitative Scanning Electron Microscopy

机译：定量扫描电子显微镜融合目标分析

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Recent developments in computer based systems for quantitative x-ray microanalysis, 4 Pi surface examination, Auger electron spectroscopy and Backscattered Microtopography measurement have extended the Scanning Electron Microscope's applications in ICF target development and production. (ERA citation 05:013192)

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作者
Ward, C. M.;
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年度 1979
页码 p.1-5
总页数 5
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Laser targets; Auger electron spectroscopy; Electron microscopy; Inertial confinement; Nondestructive testing; X-ray diffraction;

机译：激光靶;俄歇电子能谱;电子显微镜;惯性约束;无损检测; X射线衍射;

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专利

1. Morphometric, quantitative, and three-dimensional analysis of the heart muscle fibers of old rats: Transmission electron microscopy and high-resolution scanning electron microscopy methods [J] . Cury D.P., Dias F.J., Sosthenes M.C.K., Microscopy research and technique . 2013,第2期

机译：老年大鼠心肌纤维的形态，定量和三维分析：透射电子显微镜和高分辨率扫描电子显微镜方法
2. Quantitative analysis of backscattered electron (BSE) contrast using low voltage scanning electron microscopy (LVSEM) and its application to Al0.22Ga0.78N/GaN layers [J] . Cid A. Garitagoitia, Rosenkranz R., Loeffler M., Ultramicroscopy . 2018,第期

机译：使用低压扫描电子显微镜（LVSEM）对比的反向散射电子（BSE）对比度的定量分析及其在Al0.22Ga0.78N / GaN层中的应用
3. Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-II [J] . Newbury Dale E., Ritchie Nicholas W. M. Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2015,第5期

机译：扫描电子显微镜/硅漂移检测器能量色散光谱（SEM / SDD-EDS）和NIST DTSA-II对硼化物，碳化物，氮化物，氧化物和氟化物的电子激发X射线定量分析
4. QUANTITATIVE MULTI-SPECTRAL ANALYSIS OF PORTLAND CEMENT, FLY ASH AND SLAG USING SCANNING ELECTRON MICROSCOPY AND X-RAY μ-ANALYSIS [C] . Stutzman P., Snyder K.A., Bullard J.W. International Congress on the Chemistry of Cement . 2011

机译：使用扫描电子显微镜和X射线μ分析的波特兰水泥，粉煤灰和炉渣的定量多光谱分析
5. Quantitative multivariate data analysis in the examination of small signals from scanning transmission electron microscopy. [D] . Sarahan, Michael Carl. 2010

机译：定量多变量数据分析，用于检查来自扫描透射电子显微镜的小信号。
6. Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy [O] . Dale E. Newbury 2002

机译：用于低压扫描电子显微镜的定量电子探针X射线显微分析的障碍
7. Barriers to quantitative electron probe x-ray microanalysis for low voltage scanning electron microscopy [O] . D.E. Newbury 2002

机译：用于低压扫描电子显微镜的定量电子探针X射线微基分析的障碍

Fusion Target Analysis by Quantitative Scanning Electron Microscopy

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