首页> 美国政府科技报告 >Application of Compound Analysis by X-Ray Diffraction to Aerosol Provenance Studies. Progress Report, July 21, 1979-July 21, 1980. Report 80-8
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Application of Compound Analysis by X-Ray Diffraction to Aerosol Provenance Studies. Progress Report, July 21, 1979-July 21, 1980. Report 80-8

机译:X射线衍射复合分析在气溶胶种源研究中的应用。进展报告,1979年7月21日至1980年7月21日。报告80-8

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The major portion of the developmental work with required to have the x-ray methodology ready for routine compound analysis using the dichotomous filter system has been completed. Reference intensity constants for 18 specific compounds have been determined. A universal calibration curve for estimation of crystalline weight fraction of aerosol samples has been determined. The analytical methodology associated with very thin particulate layers trapped on filter media has been evaluated. Particle size attenuation errors in mass absorption measurements have been evaluated. All filter types have been evaluated as to their suitability as substrates for thin layer particulate samples. Initial analyses of aerosols on Teflon filters has been completed. Improved error analysis based on variance error methods has been completed. (ERA citation 07:047999)

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