Applications of Scanning Electron Microscopy to Failure Analysis in Ceramics and Glasses

摘要

Scanning electron microscope techniques using secondary and backscattered electron images have been applied to the fracture surface analysis of brittle materials. The principles of fracture mechanics and fracture surface analysis have been combined to understand fracture of several glasses and ceramics including: optical fibers, solar mirrors, turbine blade and infrared transmitting dome materials. The scanning electron microscope has unique capabilities for detecting extremely small fracture origins, defining phase differences and identifying inhomogeneities and inclusions. We developed a new backscatter technique which reveals the microstructures directly from the fracture surface, thereby eliminating the necessity for polishing and etching the surface which destroys fracture surface information. (ERA citation 06:017125)